Analytical Techniques for Electrically Active Defect Detection
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Elsevier
Reference95 articles.
1. Use of low-frequency capacitance in deep level transient spectroscopy measurements to reduce series resistance effects;Anand;J. Appl. Phys.,1992
2. EDEPR of impurity centers embedded in silicon microcavities;Bagraev;Physica B,2009
3. Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions;Bargallo Gonzalez;J. Electrochem. Soc.,2011
4. Near interface oxide trap capture kinetics in metal-oxide-semiconductor transistors: modeling and measurements;Bauza;J. Appl. Phys.,1998
5. Photoinduced current transient spectroscopy of deep defects in n-type ultrapure germanium;Blondeel;J. Appl. Phys.,1999
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