EDEPR of impurity centers embedded in silicon microcavities-Reference-Cited by-同舟云学术

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EDEPR of impurity centers embedded in silicon microcavities

Published:2009-12 Issue:23-24 Volume:404 Page:5140-5143
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Bagraev N.T.,Gehlhoff W.,Gets D.S.,Klyachkin L.E.,Kudryavtsev A.A.,Malyarenko A.M.,Mashkov V.A.,Romanov V.V.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Electron-dipole resonance of impurity centres embedded in silicon microcavities

2. Spin-dependent transport of holes in silicon quantum wells confined by superconductor barriers

3. Superconductivity in silicon nanostructures

4. Shallow and Deep Centers in Heavily Doped Silicon Quantum Wells

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analytical Techniques for Electrically Active Defect Detection;Semiconductors and Semimetals;2015

2. Electrically-detected electron paramagnetic resonance of point centers in 6H-SiC nanostructures;Semiconductors;2014-11

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