Determining the crystalline degree of silicon nanoclusters/SiO2 multilayers by Raman scattering
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4878175
Reference28 articles.
1. A Membrane Device for Substrate-Free Photovoltaic Characterization of Quantum Dot Based p-i-n Solar Cells
2. Tunable, narrow, and directional luminescence from porous silicon light emitting devices
3. Charge transport and electroluminescence of silicon nanocrystals/SiO2 superlattices
4. Thermal crystallization of amorphous Si/SiO2 superlattices
5. Size controlled nc-Si synthesis by SiO/SiO2 superlattices
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