On the Investigation of Specimen Contamination in the Electron Microscope
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1715049
Reference6 articles.
1. Microanalysis by Means of Electrons
2. A Discussion of the Illuminating System of the Electron Microscope
3. On the Improvement of Resolution in Electron Diffraction Cameras
4. An Effect of Electron Bombardment upon Carbon Black
5. Particle ``Growth'' in the Electron Microscope
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