Modeling of time-dependent non-uniform dielectric breakdown using a clustering statistical approach-Reference-Cited by-同舟云学术

Modeling of time-dependent non-uniform dielectric breakdown using a clustering statistical approach

Published:2013-10-07 Issue:15 Volume:103 Page:152907
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Wu Ernest Y.,Li Baozhen,Stathis James H.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4824035

Reference10 articles.

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4. Weibull breakdown characteristics and oxide thickness uniformity

5. Cost-size optima of monolithic integrated circuits

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