SPICE simulation of the time-dependent clustering model for dielectric breakdown

Author:

Salvador E.,Rodriguez R.,Miranda E.

Funder

Ministerio de Ciencia e Innovación

European Metrology Programme for Innovation and Research

Government of Catalonia Agency for Administration of University and Research Grants

Publisher

Elsevier BV

Reference25 articles.

1. Facts and myths of dielectric breakdown processes—Part II: post-breakdown and variability;Wu;IEEE Trans Electron Devices,2019

2. Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges;Chen;Mic Rel,2015

3. Series resistance and oxide thickness spread influence on weibull breakdown distribution: new experimental correction for reliability projection improvement;Roy;Mic Rel,2002

4. Modeling of time-dependent non-uniform dielectric breakdown using a clustering statistical approach;Wu;Appl Phys Lett,2013

5. Failure of weibull distribution to represent switching statistics in OxRAM;Raghavan;Mic Eng,2017

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