Calibrating an ellipsometer using x-ray reflectivity
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1379603
Reference5 articles.
1. The structure of self-assembled monolayers of alkylsiloxanes on silicon: a comparison of results from ellipsometry and low-angle x-ray reflectivity
2. X-ray specular reflection studies of silicon coated by organic monolayers (alkylsiloxanes)
3. JKR Studies of Acrylic Elastomer Adhesion to Glassy Polymer Substrates
4. Effect of Surface-Influenced Order on Thermal Expansivity of Polymer Thin Films
5. Density Perturbations in Polymers Near a Solid Substrate: An X-ray Reflectivity Study
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