Electronic charge trapping in chemical vapor‐deposited thin films of Al2O3 on silicon
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1660979
Reference11 articles.
1. Photoemission of Electrons from Silicon into Silicon Dioxide
2. Photoinjection Studies of Charge Distributions in Oxides of MOS Structures
3. Spectrally resolved photo depopulation of electron trapping defects in amorphous silica films
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