Low temperature charge carrier hopping transport mechanism in vanadium oxide thin films grown using pulsed dc sputtering
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3139864
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1. Infrared Detectors
2. 320 x 240 silicon microbolometer uncooled IR FPAs with on-chip offset correction
3. Electrical properties of vanadium oxide thin films for bolometer applications: processed by pulse dc sputtering
4. Electrical properties and degradation kinetics of compensated hydrogenated microcrystalline silicon deposited by very high‐frequency‐glow discharge
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