Influence of overlayers on determination of the optical constants of ZnSe thin films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1489068
Reference21 articles.
1. Optical characterization of pure ZnSe films grown on GaAs
2. Determination of the optical constants of ZnSe films by spectroscopic ellipsometry
3. Optical properties of ZnSe and its modeling
4. Dielectric function of epitaxial ZnSe films
5. Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation
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