Determination of the optical constants of ZnSe films by spectroscopic ellipsometry
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.358484
Reference7 articles.
1. Refractive Index of ZnS, ZnSe, and ZnTe and Its Wavelength and Temperature Derivatives
2. Optical properties of ZnSe
3. Molecular beam epitaxial growth and characterization of the dilute magnetic semiconductor Zn1−xFexSe
4. An Ellipsometry System For High Accuracy Metrology Of Thin Films
5. Dielectric properties of heavily doped crystalline and amorphous silicon from 1.5 to 6.0 eV
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