Local and transient nanoscale strain mapping during in situ deformation-Reference-Cited by-同舟云学术

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Local and transient nanoscale strain mapping during in situ deformation

Published:2016-08-22 Issue:8 Volume:109 Page:081906
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Gammer C.¹,Kacher J.¹²,Czarnik C.³,Warren O. L.⁴,Ciston J.¹,Minor A. M.¹²

Affiliation:

1. National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

2. Department of Materials Science and Engineering, University of California, Berkeley, California 94720, USA

3. Gatan, Inc., Pleasanton, California 94588, USA

4. Hysitron, Inc., Minneapolis, Minnesota 55344, USA

Funder

National Science Foundation (NSF)

Austrian Science Fund (FWF)

U.S. Department of Energy (DOE)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.4961683

Reference16 articles.

1. The mechanism of plastic deformation of crystals. Part I.—Theoretical

2. J. P. Hirth and J. Lothe , Theory of Dislocations ( Krieger Publishing Company, 1982).

3. Polymorphism of dislocation core structures at the atomic scale

4. Measurement of the displacement field of dislocations to 0.03 Å by electron microscopy

5. In situTEM nanomechanics

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