The role of crystal‐growth properties on silicon implant activation processes for GaAs
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.341818
Reference10 articles.
1. Effect of Melt Stoichiometry on Electrical Activation Uniformity of Si-Implanted Layers in Undoped Semi-Insulating GaAs
2. Effect of crystal stoichiometry on activation efficiency in Si implanted, rapid thermal annealed GaAs
3. A novel application of the vertical gradient freeze method to the growth of high quality III–V crystals
4. Experimental requirements for quantitative mapping of midgap flaw concentration in semi‐insulating GaAs wafers by measurement of near‐infrared transmittance
5. Direct observation of the principal deep level (EL2) in undoped semi‐insulating GaAs
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Mapping of the Residual Voltage of Hall Devices Fabricated by P + Si Coimplantation on GaAs Wafers;Physica Status Solidi (a);1996-06-16
2. Complete p‐type activation in vertical‐gradient freeze GaAs co‐implanted with gallium and carbon;Applied Physics Letters;1996-03-11
3. Participation ofEL2 in the donor activation of silicon implanted into GaAs;Physical Review B;1994-06-15
4. Comparison of deep centers in semi‐insulating liquid‐encapsulated Czochralski and vertical‐gradient freeze GaAs;Journal of Applied Physics;1991-06-15
5. Si-implantation into GaAs grown on Si;Journal of Electronic Materials;1990-08
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