Strain determination and microstructural characterization of 50 keV Sn‐ion‐implanted Si(001)
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.358954
Reference23 articles.
1. Predicted band gap of the new semiconductor SiGeSn
2. Structure and short-range order of vapour-deposited Si1−xSnx amorphous alloys
3. Structural study of tin and carbon coimplanted silicon
4. The growth of strained Si1−xGex alloys on 〈001〉 silicon using solid phase epitaxy
5. The annealing behaviour of ion-implanted Si studied using time-resolved reflectivity
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Vertical heterojunction photodetector of In2Se3/PtS2 with high polarization sensitivity and tunable electronic characteristics;Materials Today Communications;2024-08
2. Study on the mechanical and optical properties of SiSn alloy by first principles;Materials Today Communications;2021-09
3. Electronic and optical characteristics of GaS/g-C3N4 van der Waals heterostructures: Effects of biaxial strain and vertical electric field;Vacuum;2020-10
4. Self-organized lattice-matched epitaxy of Si1−xSnx alloys on (001)-oriented Si, Ge, and InP substrates;Applied Physics Letters;2017-11-06
5. Growth of Epitaxial SiSn Films with High Sn Content for IR Converters;Russian Physics Journal;2017-05-31
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3