Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2875776
Reference8 articles.
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4. Prospects for charged particle lithography as a manufacturing technology
5. Shape and Size Control of Regularly Arrayed Nanodots Fabricated Using Ultrathin Alumina Masks
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