Nonlinear dependence of set time on pulse voltage caused by thermal accelerated breakdown in the Ti/HfO2/Pt resistive switching devices
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4766737
Reference20 articles.
1. Switching the electrical resistance of individual dislocations in single-crystalline SrTiO3
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4. Scaling behaviors of reset voltages and currents in unipolar resistance switching
5. Reversible resistive switching of SrTiOx thin films for nonvolatile memory applications
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