Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1452782
Reference7 articles.
1. Helical microtubules of graphitic carbon
2. Nanotubes as nanoprobes in scanning probe microscopy
3. Atomic Force Microscope
4. Carbon nanotube-modified cantilevers for improved spatial resolution in electrostatic force microscopy
5. Tapping mode scanning force microscopy in water using a carbon nanotube probe
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