Carbon nanotube-modified cantilevers for improved spatial resolution in electrostatic force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.125168
Reference9 articles.
1. High‐resolution capacitance measurement and potentiometry by force microscopy
2. Kelvin probe force microscopy
3. Contact electrification using force microscopy
4. Capacitive effects on quantitative dopant profiling with scanned electrostatic force microscopes
5. High resolution atomic force microscopy potentiometry
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