Interfacial reactions in the Zr–Si system studied byinsitutransmission electron microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.359789
Reference10 articles.
1. Solid‐phase reactions and crystallographic structures in Zr/Si systems
2. Growth kinetics of amorphous interlayers by solid‐state diffusion in polycrystalline Zr and Hf thin films on (111)Si
3. Annealing of metal-metalloid multilayers studied by in situ electron microscopy
4. Polytype formation in zirconium‐silicon thin films
5. Structural and electrical properties of ZrSi2and Zr2CuSi4formed by rapid thermal processing
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