Growth kinetics of amorphous interlayers by solid‐state diffusion in polycrystalline Zr and Hf thin films on (111)Si
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.346262
Reference22 articles.
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5. Disordered intermixing at the platinum:silicon interface demonstrated by high‐resolution cross‐sectional transmission electron microscopy, Auger electron spectroscopy, and MeV ion channeling
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