Annealing of metal-metalloid multilayers studied by in situ electron microscopy
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
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2. Superlattice effects on the amorphization of Ni–Ti multilayers;Thin Solid Films;2000-12
3. Evolution of microstructure and magnetoresistance in Co/Cu multilayers during annealing;Journal of Magnetism and Magnetic Materials;1999-09
4. The baking of layer cakes;Nature;1996-08
5. Interfacial reactions in the Zr–Si system studied byinsitutransmission electron microscopy;Journal of Applied Physics;1995-10-15
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