Dispersion properties of aluminum nitride as measured by an optical waveguide technique
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.119127
Reference12 articles.
1. Low resistivity aluminum nitride: carbon (AlN : C) films grown by metal organic chemical vapor deposition
2. InGaN-Based Multi-Quantum-Well-Structure Laser Diodes
3. High‐responsivity photoconductive ultraviolet sensors based on insulating single‐crystal GaN epilayers
4. MODES OF PROPAGATING LIGHT WAVES IN THIN DEPOSITED SEMICONDUCTOR FILMS
5. Measurement of Thin Film Parameters with a Prism Coupler
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