Measurement of the band offsets between amorphous LaAlO3 and silicon
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1644055
Reference16 articles.
1. Alternative dielectrics to silicon dioxide for memory and logic devices
2. A Thermodynamic Approach to Selecting Alternative Gate Dielectrics
3. Dielectric functions and optical bandgaps of high-K dielectrics for metal-oxide-semiconductor field-effect transistors by far ultraviolet spectroscopic ellipsometry
4. Electrical properties of LaAlO3/Si and Sr0.8Bi2.2Ta2O9/LaAlO3/Si structures
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