A new approach for mapping x‐ray rocking curves
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1144018
Reference14 articles.
1. Defect structure analysis of polycrystalline materials by computer-controlled double-crystal diffractometer with position-sensitive detector
2. Mapping and analysis of microplasticity in tensile-deformed double-notched silicon crystals by computer-aided X-ray double-crystal diffractometry
3. High Resolution Digital X-Ray Rocking Curve Topography
4. PC Based Topography Technique
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1. One-dimensional defect distribution along needle-shaped PrVO4 single crystals grown by the slow-cooling method;Radiation Physics and Chemistry;2013-12
2. Consideration of several factors in the method for mapping x‐ray rocking curves;Review of Scientific Instruments;1995-09
3. Anticlastic curvature measurements on unribbed crystal optics for synchrotron radiation;Review of Scientific Instruments;1995-02
4. Measurement of radii of curvature of slightly bent crystals using a one‐dimensional detector;Review of Scientific Instruments;1993-09
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