Mapping and analysis of microplasticity in tensile-deformed double-notched silicon crystals by computer-aided X-ray double-crystal diffractometry
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference20 articles.
1. Determination of notch-tip plasticity by X-ray diffraction and comparison to continuum mechanics analysis
2. Determination of strain distribution in elastically bent materials by X-ray intensity measurement
3. Determination of strain concentration by microfluorescent densitometry of X-ray topography: A bridge between microfracture and continuum mechanics
4. Determination of the strain concentration factors around holes and inclusions in crystals by X-ray topography
5. Importance of microplasticity in the fracture of silicon
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