Alternative uses of a megavolt tandem accelerator for few-keV studies with ion-source SIMS monitoring
Author:
Affiliation:
1. Departamento de Física, Universidade Federal de Viçosa, 36570-900 Viçosa, MG, Brazil
2. Instituto de Física, Universidade Federal do Rio de Janeiro, 21941-972 Rio de Janeiro, RJ, Brazil
Funder
Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
Fundação Carlos Chagas Filho de Amparo à Pesquisa do Estado do Rio de Janeiro (FAPERJ)
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4953889
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1. Ion-beam modification of the magnetic properties ofGa1−xMnxAsepilayers
2. Electrical isolation of n- and p-In0.53Ga0.47As epilayers using ion irradiation
3. Fluorine-ion-beam modification of magnetic properties of thin GaMnAs films
4. Synthesis of cobalt nanoparticles by ion implantation and effects of postimplantation annealing
5. Spin Fluctuations of Paramagnetic Rh Clusters Revealed by X-Ray Magnetic Circular Dichroism
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