Fluorine-ion-beam modification of magnetic properties of thin GaMnAs films-Reference-Cited by-同舟云学术

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Fluorine-ion-beam modification of magnetic properties of thin GaMnAs films

Published:2015-05-07 Issue:17 Volume:117 Page:17B909
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Mello S. L. A.¹²^ORCID,Sant'Anna M. M.¹,Codeço C. F. S.¹,Dong S. N.²,Yoo T.²³,Liu X.²,Furdyna J. K.²

Affiliation:

1. Instituto de Física, Universidade Federal do Rio de Janeiro, Rio de Janeiro, 21941-972 RJ, Brazil

2. Department of Physics, University of Notre Dame, Notre Dame, Indiana 46556, USA

3. Physics Department, Korea University, Seoul 136-701, South Korea

Funder

DISSE - Instituto Nacional de CiÃªncia e Tecnologia em Nanodispositivos Semicondutores

FAPERJ - FundaÃ§Ã£o Carlos Chagas Filho de Amparo Ã Pesquisa do Estado do Rio de Janeiro

Conselho Nacional de Desenvolvimento Científico e Tecnológico (National Council for Scientific and Technological Development)

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (Coordination for the Improvement of Higher Education Personnel)

National Science Foundation (NSF)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4917512

Reference22 articles.

1. Dilute ferromagnetic semiconductors: Physics and spintronic structures

2. Electric-field control of ferromagnetism

3. Magnetization vector manipulation by electric fields

4. Spin-dependent phenomena and device concepts explored in (Ga,Mn)As

5. Ion-beam modification of the magnetic properties ofGa1−xMnxAsepilayers

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Early stages in the self-organization of Si nanopatterns induced by ion bombardment;Nanotechnology;2020-04-03

2. Uniform annealing effect of electron irradiation on ferromagnetic GaMnAs thin films;Journal of Magnetism and Magnetic Materials;2017-01

3. Alternative uses of a megavolt tandem accelerator for few-keV studies with ion-source SIMS monitoring;Review of Scientific Instruments;2016-06

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