Electrical contact resistances of thermoelectric thin films measured by Kelvin probe microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4826684
Reference29 articles.
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5. Transport properties of flash-evaporated (Bi1 − xSbx)2Te3 films I: Optimization of film properties
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