The high‐temperature (55–70 °C) device characteristics of cw (AlGa)As double‐heterostructure proton‐bombarded stripe lasers grown by molecular beam epitaxy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.92133
Reference11 articles.
1. Low‐current‐threshold and high‐lasing uniformity GaAs–AlxGa1−xAs double‐heterostructure lasers grown by molecular beam epitaxy
2. Thermal and impulse coupling to an aluminum surface by a pulsed KrF laser
3. Infrared‐visible (0.89–0.72 μm) AlxGa1−xAs/AlyGa1−yAs double‐heterostructure lasers grown by molecular beam epitaxy
4. Continuous operation over 10 000 h of GaAs/GaAlAs double‐heterostructure laser without lattice mismatch compensation
5. The reliability of a practical Ga<inf>1-x</inf>Al<inf>x</inf>As laser device
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1. Surface and bulk leakage currents in transverse junction stripe lasers;Journal of Applied Physics;1991-01-15
2. Trends of deep level electron traps in AlxGa1−xAs grown by molecular beam epitaxy;Applied Physics Letters;1988-11-14
3. Kinetics of the Staebler-Wronski effect;Physical Review B;1987-01
4. Uniformity of an embedded stripe large optical‐cavity GaAs/GaAlAs double‐heterostructure laser grown by metallo‐organic chemical vapor deposition;Journal of Applied Physics;1986-02-15
5. LPE of buried heterostructure laser devices;Progress in Crystal Growth and Characterization;1986-01
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