Optical detection of melting point depression for silver nanoparticles via in situ real time spectroscopic ellipsometry
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3681367
Reference10 articles.
1. Analysis of interband, intraband, and plasmon polariton transitions in silver nanoparticle films viain situreal-time spectroscopic ellipsometry
2. Monitoring ion etching of GaAs/AlGaAs heterostructures by real time spectroscopic ellipsometry: Determination of layer thicknesses, compositions, and surface temperature
3. A broadband analysis of the optical properties of silver nanoparticle films by in situ real time spectroscopic ellipsometry
4. Temperature dependence of the optical properties of Au, Ag and Cu
5. Spectroellipsometric characterization of plasma-deposited Au/SiO2 nanocomposite films
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