Real-Time Ellipsometry at High and Low Temperatures-Reference-Cited by-同舟云学术

Real-Time Ellipsometry at High and Low Temperatures

Published:2023-01-17 Issue:4 Volume:8 Page:3684-3697
ISSN:2470-1343
Container-title:ACS Omega
language:en
Short-container-title:ACS Omega

Author:

Mukherjee Deshabrato¹²,Petrik Peter¹³^ORCID

Affiliation:

1. Institute for Technical Physics and Materials Science, Centre for Energy Research, Budapest 1525, Hungary

2. Doctoral School of Materials Sciences and Technologies, Óbuda University, Budapest 1034, Hungary

3. Department of Electrical and Electronic Engineering, Institute of Physics, Faculty of Science and Technology, University of Debrecen, Debrecen 4032, Hungary

Funder

Orsz?gos Tudom?nyos Kutat?si Alapprogramok

Nemzeti Kutat?si Fejleszt?si ?s Innov?ci?s Hivatal

FP7 Ideas: European Research Council

Publisher

American Chemical Society (ACS)

Subject

General Chemical Engineering,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acsomega.2c07438

Reference160 articles.

1. Ueber Oberflächenschichten. I. Theil

2. Ueber Oberflächenschichten. II. Theil

3. Über spezifischen Widerstand und optische Konstanten dünner Metallschichten

4. Forces Involved in the Reaction Between Antigen and Antibody Molecules

5. Ellipsometry in Thin Film Analysis

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