Effects of hole self-trapping by polarons on transport and negative bias illumination stress in amorphous-IGZO
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4986180
Reference45 articles.
1. Present status of amorphous In–Ga–Zn–O thin-film transistors
2. Recent progress in high performance and reliable n-type transition metal oxide-based thin film transistors
3. Photo-bias instability of metal oxide thin film transistors for advanced active matrix displays
4. Highly stable amorphous In-Ga-Zn-O thin-film transistors produced by eliminating deep subgap defects
5. O-vacancy as the origin of negative bias illumination stress instability in amorphous In–Ga–Zn–O thin film transistors
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Fundamental understanding of NBTI degradation mechanism in IGZO channel devices;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14
2. Reliable measurement of the density of states including occupied in-gap states of an amorphous In–Ga–Zn–O thin film via photoemission spectroscopies: Direct observation of light-induced in-gap states;Journal of Applied Physics;2024-02-23
3. Ovonic Threshold Switch Chalcogenides: Connecting the First-Principles Electronic Structure to Selector Device Parameters;ACS Applied Electronic Materials;2022-12-26
4. The effect of charge transfer transition on the photostability of lanthanide-doped indium oxide thin-film transistors;Communications Materials;2021-08-23
5. The local atomic structure and thermoelectric properties of Ir-doped ZnO: hybrid DFT calculations and XAS experiments;Journal of Materials Chemistry C;2021
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3