Author:
Gregor R. W.,Stinebaugh W. H.
Subject
General Physics and Astronomy
Cited by
9 articles.
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1. Effect of internal gettering of iron on electrical characteristics of devices;Materials Science and Engineering: B;2009-03
2. Platinum contamination issues in ferroelectric memories;Journal of Applied Physics;2002-09-15
3. Iron contamination in silicon technology;Applied Physics A: Materials Science & Processing;2000-05-01
4. Aspects of Barium Contamination in High Dielectric Dynamic Random Access Memories;Journal of The Electrochemical Society;2000
5. Gettering in Silicon;Wiley Encyclopedia of Electrical and Electronics Engineering;1999-12-27