Oxide, interface, and border traps in thermal, N2O, and N2O‐nitrided oxides
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.361002
Reference107 articles.
1. Dynamic hot-carrier stressing of reoxidized nitrided oxide
2. Dynamic hot-carrier stressing of reoxidized nitrided oxide
3. Electrical properties of MOSFET's with N/sub 2/O-nitrided LPCVD SiO/sub 2/ gate dielectrics
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