Refractive index study of AlxGa1−xN films grown on sapphire substrates
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1598276
Reference20 articles.
1. Refractive indices of wurtzite and zincblende GaN
2. Optical constants of epitaxial AlGaN films and their temperature dependence
3. The infrared optical functions of AlxGa1−xN determined by reflectance spectroscopy
4. Optical properties of AlxGa1−xN/GaN heterostructures on sapphire by spectroscopic ellipsometry
5. Optical properties of wurtzite structure GaN on sapphire around fundamental absorption edge (0.78–4.77 eV) by spectroscopic ellipsometry and the optical transmission method
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