Note: A simple charge neutralization method for measuring the secondary electron yield of insulators
Author:
Funder
NNSFC
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4869139
Reference20 articles.
1. Secondary electron emission in the scanning electron microscope
2. Secondary electron emission from polymers and its application to the flexible channel electron multiplier
3. Microwave window breakdown experiments and simulations on the UM/L-3 relativistic magnetron
4. Power-handling capability for RF filters
5. Note: Measuring effects of Ar-ion cleaning on the secondary electron yield of copper due to electron impact
Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Suppression of Secondary Electron Emission from Nickel Surface by Graphene Composites Based on First-Principles Method;Nanomaterials;2023-09-12
2. Monte-Carlo simulation and experimental study of the effect of internal charging on the electron emission yield of amorphous SiO2 thin films;Journal of Electron Spectroscopy and Related Phenomena;2022-12
3. Effect of the Surface Morphology of Porous Coatings on Secondary Electron Yield of Metal Surface;Materials;2022-06-18
4. Measurement of total electron emission yield of insulators based on self-terminating charge neutralization;Review of Scientific Instruments;2022-05-01
5. Enhanced surface insulating performance for polystyrene by atmospheric pressure plasma jet deposition;Applied Surface Science;2020-10
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3