Suppression of Secondary Electron Emission from Nickel Surface by Graphene Composites Based on First-Principles Method

Author:

Peng Min1,Nan Chang1,Wang Dawei2ORCID,Cao Meng1,Zhang Liang1,Liu Laijun3,Liu Chunliang1,Fang Dangqi4,Zhang Yiqi1ORCID,Zhai Yonggui1,Li Yongdong1

Affiliation:

1. Key Laboratory for Physical Electronics and Devices of the Ministry of Education, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an 710049, China

2. State Key Laboratory for Mechanical Behavior of Materials, School of Microelectronics, Xi’an Jiaotong University, Xi’an 710049, China

3. Key Laboratory of Nonferrous Materials and New Processing Technology, College of Materials Science and Engineering, Guilin University of Technology, Guilin 541004, China

4. MOE Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, School of Physics, Xi’an Jiaotong University, Xi’an 710049, China

Abstract

Secondary electron emission (SEE) is a fundamental phenomenon of particle/surface interaction, and the multipactor effect induced by SEE can result in disastrous impacts on the performance of microwave devices. To suppress the SEE-induced multipactor, an Ni (111) surface covered with a monolayer of graphene was proposed and studied theoretically via the density functional theory (DFT) method. The calculation results indicated that redistribution of the electron density at the graphene/Ni (111) interface led to variations in the work function and the probability of SEE. To validate the theoretical results, experiments were performed to analyze secondary electron yield (SEY). The measurements showed a significant decrease in the SEY on an Ni (111) surface covered with a monolayer of graphene, accompanied by a decrease in the work function, which is consistent with the statistical evidence of a strong correlation between the work function and SEY of metals. A discussion was given on explaining the experimental phenomenon using theoretical calculation results, where the empty orbitals lead to an electron trapping effect, thereby reducing SEY.

Funder

National Natural Science Foundation of China

Publisher

MDPI AG

Subject

General Materials Science,General Chemical Engineering

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