Monte-Carlo simulation and experimental study of the effect of internal charging on the electron emission yield of amorphous SiO2 thin films-Reference-Cited by-同舟云学术

Monte-Carlo simulation and experimental study of the effect of internal charging on the electron emission yield of amorphous SiO2 thin films

Published:2022-12 Issue: Volume:261 Page:147265
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Gibaru Q.,Inguimbert C.,Belhaj M.,Raine M.,Lambert D.

Funder

Office National d'études et de Recherches Aérospatiales

Centre National d’Etudes Spatiales

Commissariat à l'Énergie Atomique et aux Énergies Alternatives

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

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1. Electron beams near surfaces: the concept of partial intensities for surface analysis and perspective on the low energy regime;Frontiers in Materials;2023-06-15

2. Experimental and Monte-Carlo study of double-hump electron emission yield curves of SiO2 thin films;Journal of Applied Physics;2023-04-04