Impact of firing and capping layers on long-term stability of doped poly-Si passivating contact layers-Reference-Cited by-同舟云学术

Impact of firing and capping layers on long-term stability of doped poly-Si passivating contact layers

Published:2022 Issue: Volume: Page:
ISSN:0094-243X
Container-title:SiliconPV 2021, The 11th International Conference on Crystalline Silicon Photovoltaics
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Author:

Soeriyadi Anastasia H.,Hollemann Christina,Madumelu Chukwuka,Haase Felix,Römer Udo,Brendel Rolf,Peibst Robby,Hallam Brett J.

Publisher

AIP Publishing

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0089658

Reference13 articles.

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4. K. Ramspeck, S. Zimmermann, H. Nagel, A. Metz, Y. Gassenbaur, B. Birkmann and A. Seidl, “Light Induced Degradation of Rear Passivated mc-Si Solar Cells,” in 27th European Photovoltaic Solar Energy Conference and Exhibition, 2012, pp. 861–865.

5. Light-induced activation and deactivation of bulk defects in boron-doped float-zone silicon

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1. Current status and challenges for hole-selective poly-silicon based passivating contacts;Applied Physics Reviews;2024-02-09

2. Assessing the stability of p+ and n+ polysilicon passivating contacts with various capping layers on p-type wafers;Solar Energy Materials and Solar Cells;2023-05