Assessing the stability of p+ and n+ polysilicon passivating contacts with various capping layers on p-type wafers
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials
Reference55 articles.
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3. Suppressing The Blistering of Silicon Nitride in PERC Solar Cells for High Industrial Yield;ECS Journal of Solid State Science and Technology;2024-06-03
4. Current status and challenges for hole-selective poly-silicon based passivating contacts;Applied Physics Reviews;2024-02-09
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