Contrast formation mechanism for the surface defects imaged by x‐ray topography under the condition of simultaneous specular and Bragg reflections
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.107438
Reference7 articles.
1. Theoretical Considerations on Bragg-case Diffraction of X-rays at a Small Glancing Angle
2. On X-Ray diffraction in an extremely asymmetric case
3. On the deviation from the Bragg law and the widths of diffraction patterns in perfect crystals
4. A Modified Dynamical Theory (MDT) of X-Ray Diffraction in Extremely Asymmetric Schemes
5. Synchrotron Plane Wave X-Ray Topography of 6 inch Diameter Si Crystal
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