Improvement of breakdown characteristics of a GaAs power field‐effect transistor using (NH4)2Sxtreatment
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.352931
Reference13 articles.
1. Drain avalanche breakdown in gallium arsenide MESFET's
2. The advanced unified defect model for Schottky barrier formation
3. Electronic passivation of GaAs surfaces through the formation of arsenic—sulfur bonds
4. A Model to Explain the Effective Passivation of the GaAs Surface by (NH4)2SxTreatment
5. Evidence for the passivation effect in (NH4)2Sx‐treated GaAs observed by slow positrons
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3. Fabrication of ohmic contact based on platinum to p-type compositionally graded AlGaAs layers;Journal of Physics: Conference Series;2009-01-01
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