Detection statistics of deep levels in minority carrier transient spectroscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.363991
Reference17 articles.
1. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
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3. Theoretical model of a purported empirical violation of the predictions of quantum theory
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