Determination of grain‐boundary defect‐state densities from transport measurements
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.348506
Reference13 articles.
1. Zero‐bias resistance of grain boundaries in neutron‐transmutation‐doped polycrystalline silicon
2. Grain boundary states and varistor behavior in silicon bicrystals
3. Electrical and Electronic Properties of Grain Boundaries in Silicon
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