Note: Portable total reflection X-ray fluorescence spectrometer with small vacuum chamber
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4803166
Reference14 articles.
1. Optical Flats for Use in X‐Ray Spectrochemical Microanalysis
2. Total reflection x-ray fluorescence analysis—a review
3. Total-Reflection X-Ray Fluorescence Analysis Using Monochromatic Beam
4. Analysis of Ni on Si-wafer surfaces using synchrotron radiation excited total reflection X-ray fluorescence analysis
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