An apparatus for studying sputter deposition with x rays
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1143117
Reference3 articles.
1. X‐ray total‐external‐reflection–Bragg diffraction: A structural study of the GaAs‐Al interface
2. A novel X-ray scattering diffractometer for studying surface structures under UHV conditions
3. Experimental considerations for in situ X-ray scattering analysis of OMVPE growth
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