New correlation procedure for the improvement of resolution of deep level transient spectroscopy of semiconductors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.366269
Reference15 articles.
1. Fast capacitance transient appartus: Application to ZnO and O centers in GaP p‐n junctions
2. A correlation method for semiconductor transient signal measurements
3. Transient distortion and nth order filtering in deep level transient spectroscopy (DnLTS)
4. A novel algorithm for higher order filtering in DLTS
5. High-resolution analysis of exponentially decaying transients for physics d.l.t.s. experiments
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