A novel algorithm for higher order filtering in DLTS
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
2. Transient distortion and nth order filtering in deep level transient spectroscopy (DnLTS)
3. A new method of analysis of DLTS-spectra
4. Multi-exponential analysis of DLTS
5. Frequency‐scanned deep‐level transient spectroscopy
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