Thickness dependences of ferroelectric and dielectric properties in (Bi3.15Nd0.85)Ti3O12 thin films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2185838
Reference36 articles.
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1. Temperature Dependence of Structure, Dielectric and Energy Storage Properties in Bi 3.15 Nd 0.85 Ti 3 O 12 Thin Films;Integrated Ferroelectrics;2023-09-02
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3. Polarization fluctuation behavior of lanthanum substituted Bi4Ti3O12 thin films;Journal of Applied Physics;2015-09-14
4. Thickness Dependence of Dielectric, Leakage, and Ferroelectric Properties of Bi6 Fe2 Ti3 O18 Thin Films Derived by Chemical Solution Deposition;Journal of the American Ceramic Society;2014-09-01
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