Temperature Dependence of Structure, Dielectric and Energy Storage Properties in Bi 3.15 Nd 0.85 Ti 3 O 12 Thin Films-Reference-Cited by-同舟云学术

Temperature Dependence of Structure, Dielectric and Energy Storage Properties in Bi _3.15 Nd _0.85 Ti ₃ O ₁₂ Thin Films

Published:2023-09-02 Issue:1 Volume:237 Page:11-20
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Zhao Zengcai¹,Fan Qiaolan¹,Yin Chunfeng¹,Lu Yaping¹,Jin Yuzhu¹,Zhou Yangxin¹

Affiliation:

1. School of Science, Hangzhou Dianzi University, Hangzhou, China

Funder

Zhejiang Provincial Natural Science Foundation

Fundamental Research Funds for the Provincial Universities of Zhejiang

Scientific Research Foundation of Hangzhou Dianzi University

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584587.2023.2227046

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